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Trapping and cooling of single ions for frequency metrology and quantum optics experiments
Slodička, L. ; Pham, Minh Tuan ; Lešundák, Adam ; Hucl, Václav ; Čížek, Martin ; Hrabina, Jan ; Řeřucha, Šimon ; Lazar, Josef ; Obšil, P. ; Filip, R. ; Číp, Ondřej
Single trapped ions trapped in Paul traps correspond to ideal candidates for realization of extremely accurate optical atomic clocks and practical studies of the light–atom interactions and nonlinear mechanical dynamics. These systems benefit from both, the superb isolation of the ion from surrounding environment and excellent control of its external and internal\ndegrees of freedom, at the same time, which makes them exquisite platforms for experimental studies and applications of light matter interaction at its most fundamental level. The exceptional degree of control of single or few ion's state enabled in past decade number of major advancements in the applications from the fields of experimental quantum information\nprocessing and frequency metrology, including recent realization of scalable Shor's\nalgorithm, fractional uncertainties of the frequency measurements close to 10-18 level, or simulations of complex quantum many-body effects. These results, together with the rapid advancements in the production of low-noise segmented micro-traps, promise prompt access to long-desired regimes of quantum optomechanics and further development and applications\nof optical atomic clocks.
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Principal component analysis of Raman spectroscopy data for determination of biofilm forming bacteria and yeasts
Šiler, Martin ; Samek, Ota ; Bernatová, Silvie ; Mlynariková, K. ; Ježek, Jan ; Šerý, Mojmír ; Krzyžánek, Vladislav ; Hrubanová, Kamila ; Holá, M. ; Růžička, F. ; Zemánek, Pavel
Many microorganisms (e.g., bacteria, yeast, and algae) are known to form a multi-layered structure composed of cells and extracellular matrix on various types of surfaces. Such a formation is known as the biofilm. Special attention is now paid to bacterial biofilms that are formed on the surface of medical implants, surgical fixations, and artificial tissue/vascular\nreplacements. Cells contained within such a biofilm are well protected against antibiotics and phagocytosis and, thus, effectively resist antimicrobial attack.\nA method for in vitro identification of individual bacterial cells as well as yeast colonies is presented. Figure 1 shows an an example of the biofilm formed by Staphylococcus epidermidis bacteria and Candida parapsilosis yeasts known for forming biofilms. The\npresented method is based on analysis of spectral “Raman fingerprints” obtained from the single cell or whole colony, see figure 2(top). Here, Raman spectra might be taken from the biofilm-forming cells without the influence of an extracellular matrix or directly form the bacterial/yeast colony.
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Golden nanoparticle in optical tweezers: influence of shape and orientation on optical trapping
Šiler, Martin ; Brzobohatý, Oto ; Chvátal, Lukáš ; Karásek, Vítězslav ; Paták, Aleš ; Pokorná, Zuzana ; Mika, Filip ; Zemánek, Pavel
Noble metal nanoparticles (NPs) have attracted increased attention in recent years due to various applications of resonant collective oscillations of free electrons excited with light (plasmon resonance). In contrast to bulk metal materials, where this plasmon resonance frequency depends only on the free electron number density, the optical response of gold and silver NPs can be tuned over the visible and near-infrared spectral region by the size and shape of the NP. Precise and remote placement and orientation of NPs inside cells or tissue would provide another degree of control for these applications. A single focused laser beam – optical tweezers – represents the most frequently used arrangement which provides threedimensional (3D) contact-less manipulation with dielectric objects or living cells ranging in size from tens of nanometers to tens of micrometers. It was believed that larger metal NPs behave as tiny mirrors that are pushed by the light beam radiative force along the direction of beam propagation, without a chance to be confined. However, recently several groups have reported successful optical trapping of gold and silver particles as large as 250 nm. We\noffer an explanation based on the fact that metal nanoparticles naturally occur in various nonspherical\nshapes, and their optical properties differ significantly due to changes in localized plasmon excitation.
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Secondary electron spectroscopy and energy selective imaging for the engineering of carbon based materials
Rodenburg, C. ; Masters, R. ; Lidzey, D. ; Unčovský, M. ; Vystavěl, Tomáš ; Mika, Filip
That the fine structure of secondary electron emission spectra (SES) from carbon fibres is effected by fibre crystallinity and molecular orientation and linked to engineering materials properties such as modulus was reported over three decades ago. In spite of this\nlongstanding knowledge SES are not yet widely exploited for materials engineering of carbon based materials, probably due to a lack of instrumentation that is suitable to collect SES from beam sensitive materials and also has the capability to visualise, local variation based on SES shape. Thanks to rapid advances in low voltage SEM that offer energy selective imaging, it was recently demonstrated that differences in SES for different carbon based materials can be used to map chemical variations with sub-nanometer resolution when only SE 8 < eV were\nselected to form the SEM images. Such high resolution is not surprising as the implementation of energy filtering in SEMs to improve image resolutions was previously advocated. To fully exploit energy selective imaging for materials engineering the nature of the features in the SES must be determined.
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Difraction in a scanning electron microscopie
Řiháček, Tomáš ; Mika, Filip ; Matějka, Milan ; Krátký, Stanislav ; Müllerová, Ilona
Manipulation with the primary beam phase in a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) has drawn significant attention in the microscopy community in the recent years. Although a few applications were found long before, some are still subjects of a future research. One of them is the use of electron vortex beams, which has very promising potential. It ranges from probing magnetic materials and manipulating with nanoparticles to spin polarization of a beam in an electron microscope.\nThe methods for producing electron vortex beams have undergone a lot of development in recent years as well. The most versatile way is holographic reconstruction using computer-generated holograms modifying either phase or amplitude. As the method is\nbased on diffraction, beam coherence is a very important parameter here. It is usually performed in TEM at energies of about 100 – 300 keV which are well suited for diffraction on artificial structures for two reasons. The coherence of the primary beam is often reasonable, and the diffraction pattern is easily observed. This is however not the case for a standard scanning electron microscope (SEM) with typical energy up to 30 keV.
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Correction of misalignment aberrations of a hexapole corrector using the differential algebra method
Radlička, Tomáš ; Oral, Martin
Overcoming the limitations of the Schertzer theorem is a long story in electron microscopy. Although the basic principle of a spherical aberration (C3) correction was suggested as early as in 1947 the first experimental correctors of spherical aberration were only realized in the last decade of the 20th century. The recent multipole correctors are designed for high-energy\nTEM or STEM, where the corrector system enables reaching the atomic resolution. On the other\nhand, the corrector for low-energy SEM has been developed but this type of corrector must also contain chromatic aberration (Cc) correction to reduce the effect of the non-zero energy width. Recently, the energies of SEM reach 30 keV and transmission mode (TSEM) is a standard part of the instrument. Standard resolution in TSEM is about 0.6 nm and it is limited by C3. Reaching atomic resolution with this set-up is not a real expectation because of its instability, but the resolution of about 0.2 nm would increase the field of applications. Corrector for these type of instruments should be (a) simple, compact and cheap (b) only spherical aberration of the third,\noptionally the fifth order must be corrected (c) effect of the chromatic aberration may be reduced by energy filtering. We studied design based on Rose’s hexapole corrector.
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Scanning very low energy electron microscopy for the characterization of polycrystalline metal samples
Pokorná, Zuzana ; Knápek, Alexandr
We explored the possibility of a Scanning Electron Microscopy technique for the determination of crystallographic orientation, based on the measurement of the reflectivity of very low energy electrons. Our experiments are based on the concept that in the incident electron energy range 0–30 eV, electron reflectivity can be correlated with the electronic structure of the material, which varies with the local crystallographic orientation of the specimen.\nThe motivation for the development of this technique was to achieve a quick and highresolution means for determining the crystallographic orientation of very small grains in a polycrystalline material. The key limiting factor was the cleanliness of the sample surface and also the geometrical setup of the experiment.
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The information depth of backscattered electron imaging
Piňos, Jakub ; Mikmeková, Šárka ; Frank, Luděk
Of the conventional imaging signals in the scanning electron microscope (SEM), the secondary electrons generally reflect surface properties of the sample, while the backscattered electrons (BSE) are capable of providing information about complex properties of the target down to a certain subsurface depth. Contrast mechanisms are combined according to the energy of incident electrons and energy and angular acceptance of BSE detection. In all cases, a question arises concerning the information depth of this mode. No applicable answer provides a definition declaring this depth as that from which we still obtain useful information about the object. We can employ software simulating the electron scattering in solids,\nwhile experimental approaches are also possible. Moreover, two analytic formulas can be found in the literature.
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Optimal X-ray detection for thin samples in low-energy STEM
Rozbořil, Jakub ; Oral, Martin ; Radlička, Tomáš
In many applications it is desirable to perform energy-dispersive X-ray spectroscopy (EDS) on very thin samples at low primary beam energies in a STEM. Thin samples, or lamellae, with the thickness of about 10 nm, are mostly prepared in focused ion beam instruments (FIBs), and they are used to evaluate experiments in the development of thin films and coatings, in the semiconductor industry, and in other applications. EDS then provides a map of different chemical elements or compounds in the sample, obtained by scanning the electron beam in a raster. Often the qualitative composition is known as a limited set of materials and only their distribution on the sample is to be determined. For large batches of samples fast measurements are desired to maximize utilization of expensive equipment. In this study we found a method to minimize the time needed to reliably acquire an elemental map by determining the optimal detector placement and the minimal necessary primary electron dose per pixel.
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Scanning transmission microscopy at very low energies
Müllerová, Ilona ; Mikmeková, Eliška ; Konvalina, Ivo ; Frank, Luděk
To operate down to units of eV with a small primary spot size, a cathode lens with a biased specimen was introduced into the SEM. The reflected signal, accelerated secondary and backscattered electrons, is collected by detectors situated above the specimen.\nWhen we insert a detector below the specimen, the transmitted electron signal can also be used for imaging down to zero energy. Fig. 1 also shows an example of the simulated signal trajectories of electrons that impact on the detector of reflected electrons, based on an Yttrium Aluminium Garnet (YAG) crystal, and trajectories of electrons transmitted through the specimen and incident on a semiconductor detector based on the PIN structure.
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